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  1. Standard
    Overview and Rationale of the 3rdEdition of the International Vocabulary of Metrology (VIM3)
    Chuck Ehrlich - National Institute of Standards and Technology (NIST) Content: History of the VIM Foreword to the VIM3 Structure of the VIM3 Motivation for the VIM3 Calibration Diagram Metrological Traceability Error and Uncertainty in Testing Keywords: Papers 2009, Industry, Research & Development ...
    Erstellt: 27.03.2012 15:14
     
  2. Standard
    IMEKO XIX World Congress Lisbon
    IMEKO XIX World Congress, 06.09. - 11.09.2009, Lisbon Portugal ...
    Erstellt: 07.09.2009 19:19