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    Echelle-Spectrometer at ISAS/Department Berlin, state of the art and limits
    Helmut Becker-Ross, S. Florek, M. Okruss, ISAS - Institute for Analytical Sciences / Department Berlin Content: - Echelle Grating Characteristics - Overlay of diffraction orders - The "Littrow grating equation" - High Resolving Power and Angular  Dispersion - Example  “ELIAS” - Chromatic Aberrations in Microlithography - Emission Line Analysing Spectrometer      - ELIAS - Single Beam       - ELIAS - Double Beam      - ELIAS - Quadruple Beam - DEMON Design Results - Echelle spectrograph "ARES" - Selection of alternative absorption lines - What about … Limits? Keywords:Papers 2008, Industry, Optics, Research & Development (R&D), Products & Services (P&S) ...
    Erstellt: 22.06.2012 11:41
     
  2. Standard
    Optical Spectrometer Jena
    The workshop took place on March, 11th-12th, 2008 at the Institute of Photonic Technology (IPHT) ...
    Erstellt: 20.03.2008 10:17